Product information "OTC-DT-OC-SP-032-032-GKS"
- Trusted components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Compatible with Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
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Product details
- Trusted components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Compatible with Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
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